Semiconductor memory device capable of screening a weak bit and repairing the same
US8934311B2 · kind B2 · utility
9Cited by
6References
6Claims
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Key dates
| Filing date | Sep 5, 2012 |
| Grant date | Jan 13, 2015 |
| Priority date | — |
| Expiry date | Nov 27, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/4402
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor device includes a first memory region including a plurality of memory cells; a test unit configured to test the first memory region, and detect a weak bit from among the plurality of memory cells; and a second memory region configured to store a weak bit address (WBA) of the first memory region, and data intended to be stored in the weak bit, wherein the first memory region and the second memory region include different types of memory cells.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.