Circuit and method for measuring voltage
US8935117B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 9, 2012 |
| Grant date | Jan 13, 2015 |
| Priority date | — |
| Expiry date | Jul 20, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D84/148
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing circuit in an integrated circuit indirectly measures a voltage at a node of other circuitry in the integrated circuit. The testing circuit includes a transistor having a control electrode, a first conducting electrode coupled to a first pad, a second conducting electrode coupled to a terminal of a power supply, and one or more switches for selectively coupling the control electrode to one of the node and a second pad. A method includes determining a relationship between drain current and gate voltage of the transistor when the control electrode is coupled to the second pad. A voltage at the node is determined by relating the current through the first conducting electrode of the transistor when control electrode is coupled to the node.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.