Selectable orientation bent tip calibration-free probe
US8942785B2 · kind B2 · utility
0Cited by
4References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 7, 2011 |
| Grant date | Jan 27, 2015 |
| Priority date | — |
| Expiry date | Dec 7, 2031 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B2562/0233
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A probe is provided. The probe may include a shaft portion rotatably attachable to a position sensing device, a nonlinear portion at least partially removed from a center axis of the shaft portion, and a tip disposed at a distal end of the nonlinear portion and positioned on the center axis. The nonlinear portion may be selectably rotatable about the center axis to one of a plurality of rotational orientations. The tip may have a substantially constant position relative to the position sensing device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.