Patent · US Active

Plasma processing apparatus and plasma processing method

US8945411B2 · kind B2 · utility

3Cited by
4References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 26, 2012
Grant dateFeb 3, 2015
Priority date
Expiry dateApr 9, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/68771
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention is to achieve a reduction both in size of a plasma processing apparatus and an installation area thereof. A dry etching apparatus includes a stock unit that includes a cassette storing a tray that can be conveyed and that stores substrates. In a conveying unit storing a conveying apparatus of the tray, a rotary stage is provided. Rotational angular position adjustment of the tray is performed by rotating the rotary stage placed on the tray before being subjected to dry etching and detecting a notch by a notch detecting sensor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.