Method and installation for producing a semiconductor device, and semiconductor device
US8946059B2 · kind B2 · utility
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1References
19Claims
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Key dates
| Filing date | Oct 21, 2009 |
| Grant date | Feb 3, 2015 |
| Priority date | — |
| Expiry date | Oct 18, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D30/6743
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method of producing a semiconductor device is provided, the semiconductor device including a substrate, a semiconductor layer and at least one metallization layer adjacent to at least one element chosen from the substrate and the semiconductor layer, the method including forming at least one metallization layer which, adjacent to at least one element chosen from the substrate and the semiconductor layer, includes oxygen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.