Stacked carbon-based FETs
US8952431B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 9, 2013 |
| Grant date | Feb 10, 2015 |
| Priority date | — |
| Expiry date | May 9, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D84/08
Abstract
Methods and systems for forming stacked transistors. Such methods include forming a lower channel layer on a substrate; forming a pair of vertically aligned gate regions over the lower channel layer; forming a pair of vertically aligned source regions and a pair of vertically aligned drain regions on the lower channel material, each pair separated by an insulator; forming an upper channel material over the source regions, drain regions, and gate regions; and providing electrical access to the source, drain, and gate regions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.