Patent · US Active

Method and system for detection of latent faults in microcontrollers

US8954794B2 · kind B2 · utility

0Cited by

6References

24Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Neil Hastie · Gloucester, GB
Simon Brewerton · Trowbridge, GB

Key dates

Filing date	Jun 5, 2012
Grant date	Feb 10, 2015
Priority date	—
Expiry date	Dec 22, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/1679
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Embodiments relate to systems and methods for detecting register corruption within CPUs operating on the same input data enabling non-invasive read access to and comparison of contents of at least one set of according ones of registers of different CPUs to detect corrupted registers in form of according registers with inconsistent contents.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.