Patent · US Active

Built-in-self-test for an analog-to-digital converter

US8970408B2 · kind B2 · utility

7Cited by

7References

20Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Peter Bogner · Wernberg, AT
Jaafar Mejri · Ottobrunn, DE

Key dates

Filing date	Jul 3, 2013
Grant date	Mar 3, 2015
Priority date	—
Expiry date	Jul 3, 2033

Classification

Technology area (CPC H)Electricity
CPC primaryH03M1/12
WIPO fieldBasic communication processes
WIPO sectorElectrical engineering

Abstract

A semiconductor chip with a built-in-self-test circuit including a first analog-to-digital converter (ADC) configured to convert an analog input voltage signal received at its input into a digital output voltage signal that characterizes the first ADC; and a second ADC coupled to the input of the first ADC and configured to convert the analog input voltage signal received at its input to a digital feedback voltage signal, wherein the analog input voltage signal is generated based on the digital feedback signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.