Patent · US Active

Photoresist compositions and methods of forming photolithographic patterns

US8975001B2 · kind B2 · utility

12Cited by
4References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 28, 2012
Grant dateMar 10, 2015
Priority date
Expiry dateMar 1, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/325
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Provided are photoresist compositions useful in forming photolithographic patterns. Also provided are substrates coated with the photoresist compositions and methods of forming photolithographic patterns. The compositions, methods and coated substrates find particular applicability in the manufacture of semiconductor devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.