Patent · US Active

Electrically conductive kelvin contacts for microcircuit tester

US8988090B2 · kind B2 · utility

4Cited by

6References

16Claims

0Family size

Assignee

Johnstech International Corporation · US

Inventors

Joel N. Erdman · Waconia, US
Jeffrey C. Sherry · Savage, US
Gary W. Michalko · Ham Lake, US

Key dates

Filing date	Oct 19, 2011
Grant date	Mar 24, 2015
Priority date	—
Expiry date	Jun 22, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/0466
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.