High-frequency cobra probe
US8994393B2 · kind B2 · utility
6Cited by
14References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 6, 2012 |
| Grant date | Mar 31, 2015 |
| Priority date | — |
| Expiry date | Sep 24, 2033 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49117
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test device including cobra probes and a method of manufacturing is disclosed. The test device includes a conductive upper plate having an upper guide hole and a conductive lower plate having a lower guide hole. The test device also includes a conductive cobra probe disposed between the upper guide hole of the upper plate and the lower guide hole of the lower plate. A dielectric material insulates the cobra probe from the upper plate and the lower plate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.