Patent · US Active

Enhanced electron mobility at the interface between GD2O3(100)/N-SI(100)

US9000432B2 · kind B2 · utility

0Cited by
2References
6Claims
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Key dates

Filing dateJun 25, 2014
Grant dateApr 7, 2015
Priority date
Expiry dateJun 25, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/647
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A multilayered structure is provided. The multilayered structure may include a silicon substrate and a film of gadolinium oxide disposed on the silicon substrate. The top surface of the silicon substrate may have silicon orientated in the 100 direction (Si(100)) and the gadolinium oxide disposed thereon may have an orientation in the 100 direction (Gd2O3(100)).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.