Scanning terahertz probe
US9006660B2 · kind B2 · utility
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3References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2008 |
| Grant date | Apr 14, 2015 |
| Priority date | — |
| Expiry date | Nov 19, 2030 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B5/7257
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.