Patent · US Active

Radiation hardened memory cell and design structures

US9006827B2 · kind B2 · utility

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15Claims
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Key dates

Filing dateNov 9, 2011
Grant dateApr 14, 2015
Priority date
Expiry dateJan 30, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/201

Abstract

A radiation hardened static memory cell, methods of manufacture and design structures are provided. The method includes forming one or more first gate stacks and second gate stacks on a substrate. The method further includes providing a shallow implant process for the one or more first gate stacks such that diffusion regions of the one or more first gate stacks are non-butted junction regions. The method further includes providing a deep implant process for the one or more second gates stack such that diffusions regions of the one or more second gate stacks are butted junction regions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.