Circuitry for and a method of compensating drift in resistance in eddy current probes
US9007053B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 30, 2012 |
| Grant date | Apr 14, 2015 |
| Priority date | — |
| Expiry date | Mar 14, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9046
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is an eddy current non-destructive inspection device which includes an eddy current probe with a probe conductor resistance dynamically changing due to operation conditions, such as temperature. The device further includes a signal generating circuit generating an inspection frequency signal and a low frequency signal. Sensed inspection frequency signals are processed to produce resulting signals with possible drift. A low frequency processing circuit includes a resistance calculator producing a substantially true value of the dynamic probe resistance, based on which compensation operations are configured to correct the drifted resulting signals and produce corrected resulting signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.