Patent · US Active

Wafer polishing apparatus

US9017146B2 · kind B2 · utility

1Cited by
14References
29Claims
0Family size

Assignees

Inventors

Key dates

Filing dateDec 4, 2013
Grant dateApr 28, 2015
Priority date
Expiry dateDec 4, 2033

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B53/017
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

The wafer polishing apparatus comprises a polishing plate, a polishing head capable of holding a wafer, and a slurry supplying section. The polishing plate includes: a plurality of concentric polishing zones, each of which has a prescribed width for polishing the wafer and on each of which a polishing cloth is adhered; and a groove for discharging slurry being formed between the polishing zones. A head cleaning section, which cleans the polishing head, or a wafer cleaning section, which cleans the polished wafer, is provided to a center part of the polishing plate and located on the inner side of the innermost polishing zone.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.