Calculation of analog memory cell readout parameters using code words stored over multiple memory dies
US9021334B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 1, 2013 |
| Grant date | Apr 28, 2015 |
| Priority date | — |
| Expiry date | Sep 6, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/5621
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method includes, in a memory that includes two or more memory units, storing a code word of an Error Correction Code (ECC) that is representable by a plurality of check equations, such that a first part of the code word is stored in a first memory unit and a second part of the code word is stored in a second memory unit. A subset of the check equations, which operate only on code word bits belonging to the first part stored in the first memory unit, is identified. The first part of the code word is retrieved from the first memory unit, and a count of the check equations in the identified subset that are not satisfied by the retrieved first part of the code word is evaluated. One or more readout parameters, for readout from the first memory unit, are set depending on the evaluated count.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.