Barak Baum
20Patents
6h-index
30Co-inventors
61Inventor score
Filing activity: Oct 30, 2011 → Nov 28, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9330783B1 | Identifying word-line-to-substrate and word-line-to-word-line short-circuit events in a memory block | Physics | 14 | Active |
| US8869008B2 | Adaptation of analog memory cell read thresholds using partial ECC syndromes | Electricity | 12 | Active |
| US10008278B1 | Memory block usage based on block location relative to array edge | Physics | 11 | Active |
| US8773905B1 | Identifying and mitigating restricted sampling voltage ranges in analog memory cells | Physics | 10 | Active |
| US9390809B1 | Data storage in a memory block following WL-WL short | Physics | 8 | Active |
| US9697075B2 | Efficient search for optimal read thresholds in flash memory | Physics | 6 | Active |
| US9053809B2 | Data protection from write failures in nonvolatile memory | Physics | 5 | Active |
| US9136015B2 | Threshold adjustment using data value balancing in analog memory device | Physics | 5 | Active |
| US8792281B2 | Read threshold estimation in analog memory cells using simultaneous multi-voltage sense | Physics | 4 | Active |
| US8493783B2 | Memory device readout using multiple sense times | Physics | 3 | Active |
| US10762967B2 | Recovering from failure in programming a nonvolatile memory | Physics | 2 | Active |
| US9779818B2 | Adaptation of high-order read thresholds | Physics | 1 | Active |
| US10146460B1 | Programming schemes for avoidance or recovery from cross-temperature read failures | Physics | 1 | Active |
| US8953372B2 | Memory device readout using multiple sense times | Physics | 1 | Active |
| US9021334B2 | Calculation of analog memory cell readout parameters using code words stored over multiple memory dies | Physics | 1 | Active |
| US10332608B2 | Memory block usage based on block location relative to array edge | Physics | 0 | Active |
| US9672925B2 | Storage in charge-trap memory structures using additional electrically-charged regions | Electricity | 0 | Active |
| US9349467B2 | Read threshold estimation in analog memory cells using simultaneous multi-voltage sense | Physics | 0 | Active |
| US9952779B2 | Parallel scheduling of write commands to multiple memory devices | Physics | 0 | Active |
| US9312017B2 | Storage in charge-trap memory structures using additional electrically-charged regions | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.