Patent · US Active

Scanning microscope and method for optically scanning one or more samples

US9042010B2 · kind B2 · utility

3Cited by

1References

13Claims

0Family size

Assignee

LEICA MICROSYSTEMS CMS GMBH · DE

Inventors

Bernd Widzgowski · Dossenheim, DE
Holger Birk · Meckesheim, DE
Volker Seyfried · Schallstadt, DE

Key dates

Filing date	Feb 11, 2011
Grant date	May 26, 2015
Priority date	—
Expiry date	Nov 28, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/0036
WIPO fieldOptics
WIPO sectorInstruments

Abstract

A device in the form of a scanning microscope, a device in the form of a structural unit for a microscope and a method and a device for optically scanning one or more samples. A device in the form of a scanning microscope has a light source (42), which emits an illuminating light beam (32). A focusing lens system (34) focuses the illuminating light beam (32) on a region to be examined of a sample (36). An actuator arrangement moves the focusing lens system (34) according to a prescribed scanning pattern transversely in relation to a center axis of the illuminating light beam (32) and/or in relation to a housing of a structural unit (20) that encloses the focusing lens system (34).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.