Patent · US Active

Banking of reliability metrics

US9043659B2 · kind B2 · utility

2Cited by
1References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 28, 2012
Grant dateMay 26, 2015
Priority date
Expiry dateJul 23, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/008
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In one embodiment, a processor includes at least one functional block and banking logic. The banking logic may be to determine an average reliability metric associated with the at least one functional block. The banking logic may also be to, if the average reliability metric exceeds a required level, implement a reduced reliability mode in the at least one functional block, where the reduced reliability mode is associated with a reduction in the average reliability metric. Other embodiments are described and claimed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.