Exception handling test apparatus and method
US9047401B2 · kind B2 · utility
0Cited by
3References
8Claims
0Family size
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Key dates
| Filing date | May 9, 2011 |
| Grant date | Jun 2, 2015 |
| Priority date | — |
| Expiry date | Dec 6, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F13/102
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention relates to an exception handling test apparatus and method. The exception handling test apparatus includes a generation module configured to generate a modified device driver based on a defect model and information obtained from the device manager, a hooking module configured to hook the device driver using the modified device driver, a scanning module configured to collect test information returned from the hooked modified device driver to the application while the application operates, and an analysis module configured to analyze the collected test information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.