Metrological scale
US9057630B2 · kind B2 · utility
0Cited by
1References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 21, 2009 |
| Grant date | Jun 16, 2015 |
| Priority date | — |
| Expiry date | Mar 1, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/34784
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
A method of applying a marking onto a metrological scale. The method comprises locating one or more markings on the scale substrate in a provisional state; checking whether the one or more markings located on the scale substrate are acceptable; and finalising the one or markings which are acceptable so as to transform the one or more markings into a finalised state.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.