In-situ computing system failure avoidance
US9058250B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 23, 2013 |
| Grant date | Jun 16, 2015 |
| Priority date | — |
| Expiry date | Jan 16, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3058
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A remaining time to replace can be updated taking into account time variation of a failure mechanism of a device. Starting with an initial remaining time to replace, an effective operating time can be determined periodically based on an operating parameter measured at a tracking interval, and remaining time to replace can be updated by subtracting the effective operating time. The technique can be applied to multiple failure mechanisms and to multiple devices and/or components each having multiple failure mechanisms.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.