Sample analysis
US9063065B2 · kind B2 · utility
2Cited by
2References
16Claims
0Family size
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Key dates
| Filing date | Jun 20, 2011 |
| Grant date | Jun 23, 2015 |
| Priority date | — |
| Expiry date | Dec 6, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10116
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of sample analysis comprises irradiating a sample with electromagnetic radiation such as X-rays; collecting absorption data and scattering data; and combining the absorption and scattering data. The irradiation can be in the form of a tubular beam, a detector may be placed in a plane where Debye cones diffracted from the sample overlap at a central point for the collection of the scattering data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.