Semiconductor structure and method for making same
US9064875B2 · kind B2 · utility
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4References
38Claims
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Key dates
| Filing date | Nov 21, 2011 |
| Grant date | Jun 23, 2015 |
| Priority date | — |
| Expiry date | Nov 21, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/01079
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Embodiments relate to a method for making a semiconductor structure, the method comprising: forming a seed layer in direct contact with a dielectric material; forming a masking layer over the seed layer; patterning the masking layer to expose the seed layer; forming a fill layer over the exposed seed layer; and causing the seed layer to react with the dielectric layer to form a barrier layer between the fill layer and the dielectric layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.