Island matrixed gallium nitride microwave and power switching transistors
US9064947B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 4, 2010 |
| Grant date | Jun 23, 2015 |
| Priority date | — |
| Expiry date | Aug 4, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/411
Abstract
A gallium nitride (GaN) device that has greatly superior current handling ability per unit area than previously described GaN devices. The improvement is due to improved layout topology. The layout scheme, which uses island electrodes rather than finger electrodes, is shown to increase the active area density over that of conventional interdigitated structures. Ultra low on resistance transistors can be built using the island topology. Specifically, the present invention, which uses conventional GaN lateral technology and electrode spacing, provides a means to enhance cost/effective performance of all lateral GaN structures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.