Defective block management
US9070449B2 · kind B2 · utility
6Cited by
13References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 26, 2013 |
| Grant date | Jun 30, 2015 |
| Priority date | — |
| Expiry date | Sep 24, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/1202
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a flash memory, erase blocks containing shorted or broken word lines may be used, at least in part, to store user data. Such blocks may use different parameters to those used by non-defective blocks, may be subject to different wear leveling, and may store data selected to reduce the number of access operations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.