Internal current measurement for age measurements
US9070481B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 6, 2014 |
| Grant date | Jun 30, 2015 |
| Priority date | — |
| Expiry date | Jun 6, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5006
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of operation in a non-volatile memory device, including executing a memory operation with respect to a portion of a non-volatile memory device, and measuring a current corresponding to current drawn by at least the portion of the non-volatile memory device during the memory operation. An age metric is determined for at least the portion of the non-volatile memory device based on age criteria including a characteristic of the measured current. In accordance with a determination that the age metric satisfies one or more predefined threshold criteria, one or more configuration parameters associated with the non-volatile memory device are adjusted. After the adjusting, data is read from and data to the portion of the non-volatile memory device according to the one or more adjusted configuration parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.