X-ray irradiation device and analysis device
US9080947B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 30, 2011 |
| Grant date | Jul 14, 2015 |
| Priority date | — |
| Expiry date | Jan 21, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2235/163
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
[Object] The present invention provides an X-ray irradiation device capable of adjusting the energy of X-rays in a wide range, and an analysis device equipped with the X-ray irradiation device.[Solving Means] An X-ray irradiation device according to an embodiment of the present invention focuses X-rays emitted from an X-ray generation mechanism to a predetermined focal position by a focusing mechanism. The X-ray generation mechanism has a structure which generates a plurality of X-rays having different wavelengths. The focusing mechanism has a structure in which the plurality of X-rays are focused to the same focal position by focusing elements having diffraction characteristics suitable for the wavelengths of the respective X-rays generated by the X-ray generation mechanism.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.