Patent · US Active

Design-for-manufacturing—design-enabled-manufacturing (DFM-DEM) proactive integrated manufacturing flow

US9081919B2 · kind B2 · utility

7Cited by
8References
21Claims
0Family size

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Key dates

Filing dateMar 13, 2014
Grant dateJul 14, 2015
Priority date
Expiry dateMar 13, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2119/18
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

System and methods for design-for-manufacturing and design-enabled-manufacturing (DFM-DEM) proactive integrated manufacturing flow are presented. A method includes receiving design data related to layout of an integrated circuit (IC); extracting information from the design data; and performing analysis on the extracted information. The method also enables DFM-DEM aware manufacturing applications using information stored in a knowledge database. The method further updates the knowledge database with new information learned from at least the extracted information and the analysis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.