Inventor · Santa Clara, CA, US

Vito Dai

16Patents
6h-index
19Co-inventors
59Inventor score

Filing activity: Dec 19, 2006 → Dec 31, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US8898606B1 Layout pattern correction for integrated circuits Physics 12 Active
US8555215B2 Methods for decomposing circuit design layouts and for fabricating semiconductor devices using decomposed patterns Physics 7 Active
US7757190B2 Design rules checking augmented with pattern matching Emerging Cross-Sectional Technologies 7 Active
US9081919B2 Design-for-manufacturing—design-enabled-manufacturing (DFM-DEM) proactive integrated manufacturing flow Physics 7 Active
US8418105B1 Methods for pattern matching in a double patterning technology-compliant physical design flow Physics 7 Active
US9012270B2 Metal layer enabling directed self-assembly semiconductor layout designs Electricity 6 Active
US8453089B2 Method and apparatus for pattern adjusted timing via pattern matching Physics 4 Active
US8924896B2 Automated design layout pattern correction based on context-aware patterns Physics 4 Active
US10339254B2 Integrated circuit design systems and methods Emerging Cross-Sectional Technologies 2 Active
US9023730B1 Methods for fabricating integrated circuits including generating e-beam patterns for directed self-assembly Electricity 1 Active
US9009634B2 Methods for fabricating integrated circuits including generating photomasks for directed self-assembly Performing Operations; Transporting 1 Active
US9170501B2 Methods for fabricating integrated circuits including generating photomasks for directed self-assembly Physics 1 Active
US9959380B2 Integrated circuit design systems and methods Emerging Cross-Sectional Technologies 0 Active
US11714944B2 Optimization of physical cell placement for integrated circuits Emerging Cross-Sectional Technologies 0 Active
US10936778B2 And optimization of physical cell placement Emerging Cross-Sectional Technologies 0 Active
US8910090B2 Methods involving pattern matching to identify and resolve potential non-double-patterning-compliant patterns in double patterning applications Emerging Cross-Sectional Technologies 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.