Method for measuring capacitances of capacitors
US9086450B2 · kind B2 · utility
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5References
19Claims
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Key dates
| Filing date | Oct 4, 2010 |
| Grant date | Jul 21, 2015 |
| Priority date | — |
| Expiry date | May 11, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K17/962
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A capacitor measurement circuit for measuring a capacitance of a test capacitor includes a first transistor with a first source-drain path coupled between a first capacitor plate of the test capacitor and a ground; a second transistor with a second source-drain path coupled between a second capacitor plate of the test capacitor and the ground; and a current-measuring device configured to measure a first charging current and a second charging current of the test capacitors. The first and the second charging currents flow to the test capacitor in opposite directions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.