Chu Fu Chen
27Patents
2h-index
35Co-inventors
53Inventor score
Filing activity: Mar 24, 2008 → Feb 17, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10050621B2 | Low static current semiconductor device | Electricity | 8 | Active |
| US10284195B2 | Low static current semiconductor device | Electricity | 5 | Active |
| US8418098B2 | Advisory system for verifying sensitive circuits in chip-design | Physics | 2 | Active |
| US8779796B2 | Method and apparatus for device parameter measurement | Physics | 2 | Active |
| US10644601B2 | Dead-time conduction loss reduction for buck power converters | Emerging Cross-Sectional Technologies | 2 | Active |
| US10535572B2 | Device arrangement structure assembly and test method | Electricity | 1 | Active |
| US10804895B2 | Low static current semiconductor device | Electricity | 1 | Active |
| US11075107B2 | Semiconductor structure and manufacturing method thereof | Electricity | 0 | Active |
| US10134868B2 | MOS devices with mask layers and methods for forming the same | Electricity | 0 | Active |
| US10276457B2 | Method for measuring charge accumulation in fabrication process of semiconductor device and method for fabricating semiconductor device | Electricity | 0 | Active |
| US9947762B2 | MOS devices with mask layers and methods for forming the same | Electricity | 0 | Active |
| US9086450B2 | Method for measuring capacitances of capacitors | Electricity | 0 | Active |
| US10678968B2 | Method of verifying and analyzing energy efficiency ratio EER of a heating ventilation and air conditioning HVAC chiller unit | Physics | 0 | Active |
| US10924107B2 | Low static current semiconductor device | Electricity | 0 | Active |
| US11024552B2 | Device arrangement structure assembly having adhesive tape layer | Electricity | 0 | Active |
| US12254262B2 | Calibration method for emulating group III-V semiconductor device and method for manufacturing group III-V semiconductor device | Electricity | 0 | Active |
| US10784781B2 | Transistor having asymmetric threshold voltage, buck converter and method of forming semiconductor device | Electricity | 0 | Active |
| US12406892B2 | Display defect monitoring structure | Electricity | 0 | Active |
| US12020993B2 | Test structure and testing method thereof | Electricity | 0 | Active |
| US11522453B2 | Dead-time conduction loss reduction for buck power converters | Emerging Cross-Sectional Technologies | 0 | Active |
| US11774196B2 | Heat exchange system having desired anti-scaling performance and an anti-scaling method thereof | Mechanical Engineering; Lighting; Heating | 0 | Active |
| US11842920B2 | Semiconductor structure and manufacturing method thereof | Electricity | 0 | Active |
| US9658278B2 | Method and apparatus for high voltage device crystal defect detection | Electricity | 0 | Active |
| US11936299B2 | Transistor having asymmetric threshold voltage and buck converter | Electricity | 0 | Active |
| US9236273B2 | UV protection for lightly doped regions | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.