Patent · US Active

Method and apparatus for testing integrated circuits

US9086453B2 · kind B2 · utility

1Cited by
1References
18Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 3, 2012
Grant dateJul 21, 2015
Priority date—
Expiry dateDec 23, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31721
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Aspects of the disclosure provide a testing method. The method includes supplying a power supply from a voltage regulator to a device under test (DUT). The DUT includes an adaptive voltage scaling module configured to generate a feedback signal in response to the power supply. Further, the method includes receiving the feedback signal from the DUT to the voltage regulator to regulate the power supply based on the feedback signal from the DUT, and determining whether the DUT meets a specified performance requirement while the voltage regulator regulates the power supply provided to the DUT based on the feedback signal received from the DUT.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.