Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction

US9087899B2 · kind B2 · utility

Assignee

• Peregrine Semiconductor Corporation · US

Inventors

• Christopher N. Brindle · Poway, US
• Jie Deng · South Burlington, US
• Alper Genc · San Diego, US
• Chieh-Kai Yang · Taichung, TW

Key dates

• Filing date: Mar 5, 2014
• Grant date: Jul 21, 2015
• Expiry date: Mar 5, 2034

Classification

• Technology area (CPC H): Electricity
• CPC primary: H10D30/675

Abstract

A method and apparatus for use in improving linearity sensitivity of MOSFET devices having an accumulated charge sink (ACS) are disclosed. The method and apparatus are adapted to address degradation in second- and third-order intermodulation harmonic distortion at a desired range of operating voltage in devices employing an accumulated charge sink.