Patent · US Active

Circuit and method for testing jitter tolerance

US9088399B1 · kind B1 · utility

8Cited by
4References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 3, 2014
Grant dateJul 21, 2015
Priority date
Expiry dateFeb 3, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3187
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A transceiver circuit for self-test of jitter tolerance is disclosed. The transceiver circuit includes a transmitter circuit having an output coupled to an output terminal of the transceiver and a receiver circuit having in input coupled to an input terminal of the transceiver. The transceiver also includes a loopback path configured to provide a signal transmitted by the transmitter circuit to the input of the receiver circuit. The transceiver also includes a test control circuit that causes jitter to be introduced in the signal transmitted by the transmitter circuit when the test control circuit is operating in a self-test mode, but not when the test control circuit is operating in a non-test mode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.