Patent · US Active

Integrated wavefront sensor and profilometer

US9097612B2 · kind B2 · utility

3Cited by

1References

31Claims

0Family size

Assignee

QED Technologies International, Inc. · US

Inventors

Andrew W. Kulawiec · Fairport, US
Paul Murphy · Rochester, US
Jon Fleig · Rochester, US

Key dates

Filing date	Nov 22, 2013
Grant date	Aug 4, 2015
Priority date	—
Expiry date	Jan 15, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01M11/0271
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An instrument for measuring aspheric optical surfaces includes both an optical wavefront sensor and a single-point optical profilometer. The optical wavefront sensor measures surface height variations throughout one or more areas of an aspheric test surface. The single-point profilometer measures surface height variations along one or more traces on the aspheric test surface. At least one of the traces intersects at least one of the areas, and respective spatial frames of reference for the traces and areas are relatively adapted to each other by minimizing differences between points of nominal coincidence between the areas and traces.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.