Automatic probe configuration station and method therefor

US9103876B2 · kind B2 · utility

Assignee

• PhotoDynamic Inc. · US

Inventors

• Kent Nguyen · San Jose, US
• Kaushal Gangakhedkar · San Jose, US
• David Baldwin · Roanoke, US
• Nile Alexander Light · Livermore, US
• Steve Aochi · معلمی نژاد, US
• Yan Wang · San Diego, US
• Atila Ersahin · Fremont, US
• Hai Tran · San Jose, US
• Thomas H. Bailey · San Jose, US
• Kiran Jitendra · San Jose, US
• Alan Cable · Simi Valley, US
• Dave Smiley · San Jose, US
• Thomas E. Wishard · Santa Cruz, US

Key dates

• Filing date: Jan 7, 2011
• Grant date: Aug 11, 2015
• Expiry date: Feb 4, 2032

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2893
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.