Test coverage of integrated circuits with test vector input spreading
US9103879B2 · kind B2 · utility
8Cited by
13References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 27, 2013 |
| Grant date | Aug 11, 2015 |
| Priority date | — |
| Expiry date | Apr 25, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318563
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method is provided for switching input pins to scan channels to increase test coverage. In one embodiment, a scan system connects a small number of input pins to several scan channels so that the input pins may be selectively switched. The input pins may transmit independent test vectors to test a large number of test areas on a semiconductor chip. The scan system may include a switching device such as a multiplexer (MUX).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.