X-ray imaging apparatus and wavefront measuring apparatus
US9107637B2 · kind B2 · utility
3Cited by
3References
14Claims
0Family size
Assignee
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Key dates
| Filing date | Jan 21, 2011 |
| Grant date | Aug 18, 2015 |
| Priority date | — |
| Expiry date | Dec 31, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2207/005
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
There is provided an X-ray imaging apparatus which images a specimen. The X-ray imaging apparatus comprises: an X-ray source; a diffraction grating configured to diffract an X-ray from the X-ray source; an X-ray detector configured to detect the X-ray diffracted by the diffraction grating; and a calculator configured to calculate phase information of the specimen on the basis of an intensity distribution of the X-ray detected by the X-ray detector, wherein the calculator obtains a spatial frequency spectrum from the plural intensity distributions, and calculates the phase information from the obtained spatial frequency spectrum.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.