Automated imaging of predetermined regions in series of slices
US9117102B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | May 15, 2013 |
| Grant date | Aug 25, 2015 |
| Priority date | — |
| Expiry date | Oct 25, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/18
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The invention provides a method for the magnified depiction of samples, wherein at least two sections from a sample, which are present on at least one sample carrier, are depicted in magnified form using an apparatus for the magnified depiction of samples, wherein the sample carrier is connected to the apparatus via a sample carrier holder, wherein the position of the depicted sample carrier regions in relation to the apparatus and the magnification stage used are recorded, at least one selected feature contained in the image information from the sections depicted in magnified form, particularly at least one suitable contour and/or structure, is/are used to define local coordinate systems, which are specific to the respective section, for the at least two sections depicted in magnified form, at least one region within at least one of the sections depicted in magnified form is/are selected (selection region) and the relative position of this at least one selection region in relation to the local coordinate system defined for the respective section, and the position of said selection region in relation to the apparatus, are ascertained, the relative position of this at least one sele…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.