Failure cause diagnosis system and method
US9122273B2 · kind B2 · utility
2Cited by
0References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 26, 2010 |
| Grant date | Sep 1, 2015 |
| Priority date | — |
| Expiry date | Jun 17, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/24042
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
The invention is related to a system and a method to determine whether a target equipment deviates from a normal state. If it is determined that the target equipment to be diagnosed deviates from the normal state, the degree of deviation of each parameter from the normal state as the reference is calculated as an abnormal contribution ratio. A failure cause is estimated from a similarity ratio between the calculated abnormal contribution ratio and the abnormal contribution ratio of each of the failure causes collected in the past and including failure phenomena and failure parts.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.