Dynamic trim method for non volatile memory products
US9129710B1 · kind B1 · utility
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25Claims
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Key dates
| Filing date | Jan 13, 2014 |
| Grant date | Sep 8, 2015 |
| Priority date | — |
| Expiry date | Mar 3, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/50
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A dynamic trim method includes testing a selected number of cells on a die with predetermined testing margins. Data from this testing is used to determine dynamic reference margins for improving yield. Advantageously, yield is improved by allowing functioning fast or slow units to pass wafer sort by applying the dynamic reference margins for varying processes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.