Determination of electromigration susceptibility based on hydrostatic stress analysis
US9135391B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 26, 2013 |
| Grant date | Sep 15, 2015 |
| Priority date | — |
| Expiry date | Nov 26, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/394
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Aspects of the invention relate to techniques for determining the electromigration features corresponding to layout design data. According to various examples of the invention, a circuit design is analyzed to determine voltages of nodes in an interconnect tree. From the voltages of the nodes, current density values and current directions for the segments of the interconnect tree are determined. Based on the current density values and the current directions, hydrostatic stress values for the nodes are computed under a steady-state condition and conservation of the conductive material within the interconnect tree. The electromigration susceptibility of the interconnect tree is then determined based on the computed hydrostatic stress values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.