Method for determining geometric imaging properties of a flat panel detector, correspondingly adapted X-ray inspection system and calibration phantom

US9146327B2 · kind B2 · utility

Assignee

• GE Sensing & Inspection Technologies GmbH · DE

Inventors

• Alexander Suppes · Garbsen, DE
• Pavel Pokutnev · Wunstorf, DE
• Eberhard Neuser · Wunstorf, DE
• Nils Rothe · Hürth, DE

Key dates

• Filing date: Nov 18, 2013
• Grant date: Sep 29, 2015
• Expiry date: Jan 3, 2034

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/419
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and system for determining geometric imaging properties of a flat panel detector in an x-ray inspection system are described herein. The method can include arranging a calibration phantom between an x-ray source and the flat panel detector, the calibration phantom including at least one discrete geometric object. Additionally, the method can include recording at least one x-ray image of the calibration phantom with the flat panel detector. At least one discrete geometric shape is generated in the x-ray image by imaging the at least one discrete geometric object of the calibration phantom. Further, the method can include determining a location-dependent distortion error of the flat panel detector from the at least one x-ray image on the basis of at least one characteristic of the at least one discrete geometric shape. All characteristics of the at least one discrete geometric shape used for determining the location-dependent distortion error are independent of the dimensions of the calibration phantom.