Patent · US Active

Retention logic for non-volatile memory

US9147501B2 · kind B2 · utility

5Cited by
9References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 28, 2013
Grant dateSep 29, 2015
Priority date
Expiry dateOct 11, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/50016
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit memory device includes an array of non-volatile, charge trapping memory cells, configured to store data values in memory cells in the array using threshold states, including a higher threshold state characterized by a minimum threshold exceeding a selected read bias. A controller includes a stand-by mode, a write mode and a read mode. Retention check logic executes on power-up, or during the stand-by mode, to identify memory cells in the higher threshold state which fail a threshold retention check. Also, logic is provided to reprogram the identified memory cells.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.