Patent · US Active

Surface texture measurement device, controller for surface texture measurement device, and method for controlling the same

US9151589B2 · kind B2 · utility

3Cited by

3References

6Claims

0Family size

Assignee

Mitutoyo Corporation · JP

Inventors

Toshihiro Kanematsu · Yokohama, JP
Hiroomi Honda · Miyazaki, JP

Key dates

Filing date	Mar 1, 2013
Grant date	Oct 6, 2015
Priority date	—
Expiry date	Jun 20, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01B21/30
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A surface texture measurement device capable of resolving errors for each entire display range, a controller for the surface texture measurement device, and a method for controlling the surface texture measurement device that includes selecting any one of the display ranges as a reference range and defining a calibration measurement value for each display range; sequentially inputting the calibration measurement values in place of the measurement values to the range amplifier corresponding to the reference range to obtain a reference display value rDATAi; inputting the calibration measurement values to the range amplifiers corresponding to each display range, then obtaining an AD-converted value ADi and a display value DATAi; computing a gain error rate ki=rDATAi/DATAi, a display resolution DIVi=DATAi/ADi, and a corrected display resolution cDIVi=DIVi×ki; and displaying the corrected display value cDIVi=DIVi×ki.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.