Patent · US Active

Two step method of rapid curing a semiconductor polymer layer

US9159547B2 · kind B2 · utility

2Cited by
4References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 17, 2013
Grant dateOct 13, 2015
Priority date
Expiry dateSep 17, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/13091
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device and method of making the semiconductor device is described. A semiconductor die is provided. A polymer layer is formed over the semiconductor die. A via is formed in the polymer layer. The polymer layer is crosslinked in a first process. The polymer layer is thermally cured in a second process. The polymer layer can comprise polybenzoxazoles (PBO), polyimide, benzocyclobutene (BCB), or siloxane-based polymers. A surface of the polymer layer can be crosslinked by a UV bake to control a slope of the via during subsequent curing. The second process can further comprise thermally curing the polymer layer using conduction, convection, infrared, or microwave heating. The polymer layer can be thermally cured by increasing a temperature of the polymer at a rate greater than or equal to 10 degrees Celsius per minute, and can be completely cured in less than or equal to 60 minutes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.