Patent · US Active

System and method for testing a radio frequency integrated circuit

US9166706B2 · kind B2 · utility

4Cited by

29References

19Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventor

Hans Peter Forstner · Ebersberg, DE

Key dates

Filing date	Mar 5, 2014
Grant date	Oct 20, 2015
Priority date	—
Expiry date	Apr 12, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/3187
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In an embodiment, a method of testing a radio frequency integrated circuit (RFIC) includes generating high frequency test signals using the on-chip test circuit, measuring signal levels using on-chip power detectors, and controlling and monitoring the on-chip test circuit using low frequency signals. The RFIC circuit is configured to operate at high frequencies, and an on-chip test circuit that includes frequency generation circuitry configured to operate during test modes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.