Patent · US Active

Surface texture measuring machine and a surface texture measuring method

US9170084B2 · kind B2 · utility

0Cited by
1References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 28, 2013
Grant dateOct 27, 2015
Priority date—
Expiry dateFeb 5, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B21/047
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A surface texture measuring method includes: moving a stylus toward an origin point; and, when the stylus reaches the origin point, braking the stylus to be stopped after overrunning the origin point waiting for a measurement start command (approach section setting operation); bringing the stopped stylus into contact with a target portion of the workpiece (workpiece setting operation); moving the stopped stylus in a measurement direction reverse to the overrunning (approach operation); and, when the stylus passes the origin point in the approach operation, continuing the movement of the stylus while acquiring data detected by the detector (measurement operation).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.